Precision stages for imaging research

Xeryon was founded by academic researchers. We know that you need results that can be published. We understand that you only have one research budget.

Fast

Your customers want to move quickly. Scanning the environment from different positions takes a lot of time, so fast positioning of optical equipment within the surveying device and high-speed scanning are essential. The patented Xeryon Crossfixx™ technology allows positioning velocities up to 200mm/s for our linear stages and 2 rotations per second for the rotary stages – but always with the precision you expect from Xeryon equipment!

Shutter

Amazing shutters

The Xeryon linear shutters are based on the same ultrasonic piezo technology, resulting in extremely compact and very fast shutters.

Compact and light

The precision stages in our standard range are the size of a box of matches and weigh less than 100g, allowing you to create complex and stiff setups in the restricted volume of a SEM. The exact dimensions are detailed on the specs.

The Xeryon engineering team creates customised solutions for your specific needs, that can reduce the weight even further to a few grams – and the volume to the size of a fingertip! Visit our custom section for more information.

XLS-1-80 linear stage

Super sharp images

Xeryon ultrasonic piezo stages and shutters contain no moving parts, except for the vibrating piezo element and the moving functional component. So you can forget about fragile transmission or reduction components like gears and wormwheels that create vibrations.

The piezo motor blocks the slide in place, thanks to the mechanical tension between the components, and thus protects it against free sliding without any vibrations. If a forced movement takes place, this does not damage the piezo stage, as there is no effect of inverse transmission or reduction which would cause high forces on the components.

Xeryon stages are often used in a Scanning Electron Microscope (SEM)

Applications

Xeryon piezo stages are perfect for:

  • SEM setups
  • Optical microscopy experiments
  • Laser beam manipulation
  • Positioning of mirrors, lenses, filters, …
  • Sample manipulation
  • Total stations
  • Landscape scanning
  • 3D scanning